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2 edition of 11th IEEE International On-Line Testing: Iolts 2005: Proceedings found in the catalog.

11th IEEE International On-Line Testing: Iolts 2005: Proceedings

Ieee International On-Line Testing (11th

11th IEEE International On-Line Testing: Iolts 2005: Proceedings

Saint Raphael, French Riviera, France, 6-8 July 2005.

by Ieee International On-Line Testing (11th

  • 288 Want to read
  • 35 Currently reading

Published by Institute of Electrical & Electronics Enginee .
Written in English


The Physical Object
FormatHardcover
Number of Pages326
ID Numbers
Open LibraryOL10967192M
ISBN 100769524060
ISBN 109780769524061

On-Line monitoring for analog and sensor-based systems, Special session organisation on 16th IEEE International On-Line Testing Symposium (IOLTS'10), Corfy, GREECE, 3 Stratigopoulos H., Mir S., Adaptive alternate analog test, IEEE International Test Workshop on Defect and Adaptive Test Analysis (DATA'12), Anaheim, CA, UNITED STATES, Journal and Book Series Ranking () Year 15th IEEE International On-Line Testing Symposium, IOLTS conference and proceeding 0: Proceedings - 11th EUROMICRO Conference on Digital System Design Architectures, Methods and Tools, DSD On-Line Testing and Robust System Design, 24th IEEE International Symposium, IOLTS , Proceedings, pages Platja d’Aro, Costa Brava, Spain, July Platja d’Aro, Costa Brava, Spain, July Manuel G. Gericota, Gustavo R. Alves, Miguel L. Silva, José M. Ferreira, "Active Replication: Towards a Truly SRAM-based FPGA On-Line Concurrent Testing," Proceedings of the 8th IEEE International On-Line Testing Workshop (IOLTW’02), Ilha .

On-Line Testing Symposium (IOLTS), IEEE 16th International, pp. Proceedings of the 11th International Conference on Financial cryptography and 1st International conference on Usable Security, ECOOP Object-Oriented Programming, , Springer.


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11th IEEE International On-Line Testing: Iolts 2005: Proceedings by Ieee International On-Line Testing (11th Download PDF EPUB FB2

Get this from a library. 11th IEEE International On-Line Testing Symposium, IOLTS ; 6 - 8 July[Saint Raphael, French Riviera, France ; proceedings]. [Cecilia Metra; International On-Line Testing Symposium; IEEE Computer Society Test Technology Technical Committee].

Get this from a library. 11th IEEE International On-Line Testing Symposium: IOLTSSaint Raphaël, French Riviera, France, July [C Metra; IEEE Computer Society. Technical Council on Test Technology.;]. IOLTS 11th IEEE International On-Line Testing Symposium, July, IOLTS Side-channel issues for designing secure hardware implementations: Author(s): IOLTS 11th IEEE International On-Line Testing Symposium, July, IOLTS Cited by: T3 - Proceedings - 11th IEEE International On-Line Testing Symposium, IOLTS SP - EP - BT - Proceedings - 11th IEEE International On-Line Testing Symposium, IOLTS T2 - 11th IEEE International On-Line Testing Symposium, IOLTS Y2 - 6 July through 8 July ER -Cited by: Scrubbing and partitioning for protection of memory systems On-Line Testing Symposium, IOLTS 11th IEEE International.

Proceedings of the 11th. On transistor level gate sizing for increased robustness to transient faults On-Line Testing Symposium, IOLTS 11th IEEE International.

Proceedings of the 11th IEEE. Software Analysis for Transient Faults: A Review of Recent Methods. Authors; Authors and affiliations; Vanhauwaert, P.: Evaluation of set and seu effects at multiple abstraction levels.

In: 11th IEEE International On-Line Testing Symposium, IOLTSpp. – IEEE () Author: Guochang Zhou, Baolong Guo, Xiang Gao, Weikang Ning, Yunyi Yan. This paper proposes a practical fault attack on two asynchronous DES crypto-processors, a reference version and a hardened version, using round reduction.

12th IEEE International On-Line Testing Symposium (IOLTS), Lake of Y., Renaudin, M., Leveugle, R.: Hardening Techniques against Transient Faults for Asynchronous Circuits. In: 11th Cited by: Title: Publisher: Begin Year: End Year: Source: OAH Magazine of History: JSTOR: IITK: Obesity Research and Clinical Practice: ELSEVIER: Present: INDEST.

Find out more about Lancaster University's research activities, view details of publications, outputs and awards and make contact with our researchers. In Proceedings of the 16th IEEE International On-Line Testing Symposium (IOLTS ), Corfu Island, Greece, July "Seamless Cross-Domain Connectivity for Enabling Domain Autonomy in a Federated SOA" (with Ignacio Silva-Lepe, Isabelle Rouvellou, and Rahul Akolkar).

In Proceedings of the 8th IEEE International Conference on Web Services. Proceedings of the 11th IEEE International On-Line Testing: Iolts 2005: Proceedings book IEEE International Symposium on Signal Processing and Information Technology, AMUN - autonomic middleware for ubiquitous environments applied to the smart doorplate Wolfgang Trumler, Faruk Bagci, Jan Petzold, Theo Ungerer.

[C45] M. Skitsas, C. Nicopoulos, and M.K. Michael, “Toward efficient check-pointing and rollback under on-demand SBST in chip multi-processors,” in Proceedings of the IEEE International On-Line Testing Sym- posium (IOLTS), July IEEE 21st International On-Line Testing Symposium (IOLTS) (Halkidiki, Greece, July) p.

Piscataway, NJ, USA: IEEE. Yves Blaquière, Yan Basile-Bellavance, Safa Berrima, Yvon Savaria. «Design and validation of a novel reconfigurable and defect tolerant JTAG scan chain. Proceeding of the 18th IEEE International On-Line Testing Symposium (IOLTS '12), Sitges, Spain, p.

; Impact of Instruction Cache and Different Instruction Scratchpads on the WCET Estimate Stefan Metzlaff, Theo Ungerer Proceedings of the The 9th IEEE International Conference on Embedded Software and Systems (ICESS), p. {72} J. Aidemark, P. Folkesson and J.

Karlsson, "On the probability of detecting data errors generated by permanent faults using time redundancy," Proceedings of the 9th IEEE International On-Line Testing Symposium (IOLTS'03), ]]Cited by: M.S. Khan, S. Hamdioui, Modeling and Mitigating NBTI in Nanoscale Circuits (July ), 17th IEEE International On-Line Testing Symposium (IOLTS), JulyAthens, Greece [Conference Paper] M.

Taouil, S. Hamdioui, Layer Redundancy Based Yield Improvement for 3D Wafer-to-Wafer Stacked Memories (May ), 16th IEEE European Test. IEEE International On-Line Testing Symposium /Workshop IOLTS/IOLTW) ( – today) A.

Paschalis, 11th IEEE International On-Line Testing SymposiumFrance, July “Test Generation Methodology for High-Speed Floating Point Adders”, G. Xenoulis, M. Psarakis, D. Gizopoulos, A.

Paschalis, 11th IEEE International On-Line Testing. Brazilian Book Chapters; Editor of Proceedings; Brazilian Conferences; Using an Automatic Layout Generator: Case Study. In: 11th IEEE International On-Line Testing Symposium - IOLTSSaint Raphael, France, JulyAging Monitoring for Safety-Critical Applications, IEEE International On-Line Test Symposium, IOLTS Ricardo J.

Machado is a full professor of Information Systems Engineering and Technology in the Dept. of Information Systems at the University of Minho (UMinho), School of the Information Systems Engineering domain, his primary research interests are in modelling and requirements for systems analysis and design and in process.

52 "Highly Reliable Power Aware Memory Design" Proceedings of IEEE International On-Line Testing Symposium (IOLTS), pp.Hersonisos of Heraklion, Crete, Greece, July(with Costas Argyrides). IEEE International On-Line Testing Symposium (IOLTS), July IEEE International On-Line Testing Symposium, Athens, Greece, July R.

Kumar, D. Tullsen, T. Constantinou, in Computer Architecture Letters, Jan. The Duplication of Content in Instruction Caches and its Performance Implications - M.

Kleanthous, Y. Sazeides. IEEE 20th International On-Line Testing Symposium (IOLTS) Publications: conference_item IEEE 11th International New Circuits and Systems Conference (NEWCAS) Publications: IEEE 20th International On-Line Testing Symposium (IOLTS) (Platja d'Aro, Girona, Spain, July) p.

The role of technical functional analysis in innovative design of bespoke rapid manufactured parts: medical industry applications Lupeanu, M., Rosu, M-M., Rennie, A., Neagu, C.

& Brooks, H., 06/, Advances in Production, Automation and Transportation Systems: Proceedings of the 6th WSEAS International Conference on Manufacturing Engineering, Quality and Production. Publications by Johan Karlsson Conference Publications. Di Leo, F.

Ayatolahi, B. Sangchoolie, J. Karlsson, R. Johansson, “On the Impact of Hardware Faults - An Investigation of the Relationship between Workload Inputs and Failure Mode Distributions”, International Conference on Computer Safety, Reliability, and Security, SAFECOMPMageburg, 25 - 27.

Lake Bu, and M. Karpovsky “A Hybrid Self-Diagnosis Mechanism with Defective Nodes Locating and Attack Detection for Parallel Computing Systems“, Proc. 22nd IEEE On-Line Testing Symposium (IOLTS), Program Co-Chair of the 11th IEEE International On-Line Testing Symposium (IOLTS), JulyCote Azur (France), ; Program Co-Chair of the 10th IEEE International On-Line Testing Symposium (IOLTS), JulyMadeira (Portugal), ; Program Co-Chair of the 9th IEEE International On-Line Testing Symposium (IOLTS), JulyKos (Greece),   11th IEEE International On-Line Testing Symposium,IOLTS6 - 8 July[Saint Raphael, French Riviera, France, proceedings], S.

- ISBN In: 15th IEEE International On-Line Testing Symposium,Sesimbra-Lisbon. 15th IEEE International On-Line Testing Symposium. 15th IEEE International On-Line Testing Symposium. Los Alamitos: IEEE, p. IEEE International On-Line Testing Symposium (IOLTS), July [S34/ ] Sophie Dupuis, Papa-Sidi Ba, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre A Novel Hardware Logic Encryption Technique for thwarting Illegal Overproduction and Hardware Trojans, IEEE International On-Line Testing Symposium (IOLTS), July [P Abstract An important step in the development of dependable systems is the validation of their fault tolerance properties.

Fault injection has been widely used for this purpose, however with the rapid increase in processor complexity, traditional techniques are. [72] J. Aidemark, P. Folkesson and J. Karlsson, "On the probability of detecting data errors generated by permanent faults using time redundancy," Proceedings of the 9th IEEE International On-Line Testing Symposium (IOLTS'03), André V.

Fidalgo, Gustavo R. Alves, Manuel C. Felgueiras, Manuel G. Gericota, "Using test infrastructures for (remote) online evaluation of the sensitivity to SEUs of FPGAs", Proceedings of the 15th IEEE On-Line Testing Symposium (IOLTS'), Sesimbra, Lisboa, Portugal, Junepp.

ISBN Publications J. Bělohoubek, P. Fišer, and J. Schmidt, "Standard Cell Tuning Enables Data-Independent Static Power Consumption", in Proc. of 23rd Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), April, Novi Sad, Serbia (accepted). Software based fault tolerance: a survey.

detecting data errors generated by permanent faults using time redundancy," Proceedings of the 9th IEEE International On-Line Testing Symposium (IOLTS'03), ]] "Fault Recovery Based on Checkpointing for Hard Real-Time Embedded Systems," Proceedings of the 18th IEEE International Symposium on.

In Proceedings of the International Conference on Computer-Aided Design Raghavan Kumar; Philipp Jovanovic and Ilia Polian. In IEEE 20th International On-Line Testing Symposium, IOLTS Ilia Polian; Bernd Becker and Wolfram Burgard.

In 17th IEEE International On-Line Testing Symposium (IOLTS ), July,Athens, Greece. In, 2nd IEEE International Conference on Emerging Technologies (IEEE-ICET), Peshawar, Pakistan, 13 - 14 NovShafik, Rishad Ahmed () Congestion Control of Ad Hoc Wireless LANs: A Control-theoretic paradigm to digital filter based solution.

University of Southampton, School of Electronics and Computer Science, Masters Thesis. Brown, J. Watling, A. Asenov, G. Bersuker and P. Zeitzoff, Intrinsic parameter fluctuations in MOSFETs due to structural non-uniformity of high-κ gate stack materials, Proc.

International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), IEEE Cat. 05TH, September, Tokyo, Japan, pp, In Proceedings of the 24th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS’18), Platja d’Aro, Spain,pp In Proceedings of the 22nd IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS In Proceedings of the IEEE International Symposium on Defect and Fault.

PFEIFER, P., PLIVA, Z.: Investigating Diachrony of Programmable Microelectronic Nanostructures. In: Proceedings of the 11th IEEE International workshop on Electronics, Control, Measurement and Signals (ECMSM). deterministic test vectors, On-Line Testing Symposium (IOLTS), IEEE 16th International Proceedings, Corfu, pp.

Background. Dr Rishad Shafik is a Lecturer (i.e. Assistant Professor) in Electronic Systems within the Microsystems Research to this role, he worked in various other research, consultancy and teaching roles at University of Southampton, University of Bristol, NMI and IUT, Rishad received PhD and MSc (with distinction) degrees from the University of .In IEEE 21st International On-Line Testing Symposium (IOLTS) (Proceedings of the IEEE International On-Line Testing Symposium).

IEEE. DOI: R., & Al-Hashimi, B. (). Behavioural modeling and simulation of a switch-current phase locked loop. Paper presented at IEEE International Behavioral Modeling and Simulation Conference, United.Resume.

Mark Karpovsky Professor, Director of Reliable Computing Laboratory. Boston University. Department of Electrical and Computer Engineering 8 Saint Mary’s Street, Boston, Massachusetts Tampere International Center for Signal Processing. Finland.